ATEX^© is now equipped for High Angular Resolution

Related Publications

• Characterization of a nanopipe dislocation in GaN by means of HR-EBSD and field dislocation mechanics analysis

  C. Ernould, V. Taupin, B. Beausir, J.-J. Fundenberger, N. Maloufi, J. Guyon, E. Bouzy

  Materials Characterization 2022, 194, 112351.

• Advances in Imaging and Electron Physics, Book Chapters

  C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy

  Ch.1 - Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods.
  Ch.2 - Development of a homography-based global DIC approach for high-angular resolution in the SEM.
  Ch.3 - Implementing the homography-based global HR-EBSD/TKD approach.
  Ch.4 - Numerical validation and influence of optical distortions on accuracy.
  Ch.5 - Applications of the method.

• Facilitating the occurrence of dynamic recrystallization in plain extra low-carbon steel by warm asymmetric rolling

  S.S. Dhinwal, C. Ernould, B. Beausir

  Materials Characterization 2022, 189, 111942.

• Integrated correction of optical distortions for global HR-EBSD techniques

  C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy

  Ultramicroscopy 2021, 221, 113158.

• Global DIC approach guided by a cross-correlation based initial guess for HR-EBSD and on-axis HR-TKD

  C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy

  Acta Materialia 2020, 191, 131-148.

• Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD

  C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy

  Scripta Materialia 2020, 185, 30-35.

• Développement et application d’une méthode à haute résolution angulaire pour la mesure des gradients d’orientation et des déformations élastiques par microscopie électronique à balayage.

  C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy

  Thesis Clément Ernould (In French)

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