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C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy
Ch.1 - Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods.
Ch.2 - Development of a homography-based global DIC approach for high-angular resolution in the SEM.
Ch.3 - Implementing the homography-based global HR-EBSD/TKD approach.
Ch.4 - Numerical validation and influence of optical distortions on accuracy.
Ch.5 - Applications of the method.

S.S. Dhinwal, C. Ernould, B. Beausir
Materials Characterization 2022, 189, 111942.

C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy
Ultramicroscopy 2021, 221, 113158.

C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy
Acta Materialia 2020, 191, 131-148.

C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy
Scripta Materialia 2020, 185, 30-35.

C. Ernould, B. Beausir, J.-J. Fundenberger, V. Taupin, E. Bouzy
Thesis Clément Ernould (In French)