ATEX© - Analysis Tools for Electron and X-ray diffraction
2025
D. Han, C. Chen, M. Wang, N. Siredey-Schwaller, Z. Du, S. Yang, F. Shi, B. Beausir, A. Tongne, L. S. Toth
Materials Characterization 2025, 225, 115180
L. Wang, H.-L. Yan, Y. Zhang, B. Beausir, W. Gan, P. Laurent, N. Siredey-Schwaller, C. Esling, X. Zhao, L. Zuo
International Journal of Plasticity 2025, 186, 104260.